AMAT 0100-94053 光束剖面儀
1.產(chǎn) 品 資 料 介 紹：
中文資料：
AMAT 0100-94053光束剖面儀是一款用于測(cè)量光束質(zhì)量、光束尺寸和光束剖面的儀器。它能夠提供快速、準(zhǔn)確的光束參數(shù)測(cè)量，廣泛應(yīng)用于激光加工、光通信、生物醫(yī)學(xué)等領(lǐng)域。
以下是該光束剖面儀的主要特點(diǎn)：
- 高精度測(cè)量：采用先進(jìn)的光學(xué)技術(shù)和圖像處理算法，能夠高精度地測(cè)量光束質(zhì)量、光束尺寸和光束剖面，準(zhǔn)確反映光束的特性。
- 實(shí)時(shí)顯示：儀器配備高分辨率的顯示屏，能夠?qū)崟r(shí)顯示測(cè)量結(jié)果和光束圖像，方便用戶進(jìn)行觀察和分析。
- 易于操作：提供簡(jiǎn)潔明了的操作界面和友好的用戶交互，方便用戶進(jìn)行儀器設(shè)置和測(cè)量操作。
- 多種測(cè)量模式：支持多種不同的測(cè)量模式，滿足不同應(yīng)用場(chǎng)景的需求。
- 可擴(kuò)展性強(qiáng)：支持多種不同類型的擴(kuò)展模塊，方便用戶根據(jù)實(shí)際需求進(jìn)行功能擴(kuò)展。
總之，AMAT 0100-94053光束剖面儀是一款功能強(qiáng)大、性能卓越的光束測(cè)量?jī)x器，適用于各種需要進(jìn)行光束質(zhì)量檢測(cè)和分析的應(yīng)用場(chǎng)景。
英文資料
AMAT 0100-94053 beam profiler is an instrument used to measure beam quality, beam size, and beam profile. It can provide fast and accurate measurement of beam parameters, and is widely used in fields such as laser processing, optical communication, biomedicine, etc.
The following are the main features of the beam profiler:
High precision measurement: using advanced optical technology and image processing algorithms, it can accurately measure the beam quality, beam size, and beam profile, reflecting the characteristics of the beam.
Real time display: The instrument is equipped with a high-resolution display screen, which can display measurement results and beam images in real time, making it convenient for users to observe and analyze.
Easy to operate: Provides a concise and clear operating interface and friendly user interaction, making it convenient for users to set up instruments and perform measurement operations.
Multiple measurement modes: Support multiple different measurement modes to meet the needs of different application scenarios.
Strong scalability: Supports various types of extension modules, making it convenient for users to expand their functions according to their actual needs.
In summary, the AMAT 0100-94053 beam profiler is a powerful and high-performance beam measurement instrument suitable for various application scenarios that require beam quality detection and analysis.
2.產(chǎn) 品 展 示
3.主 營(yíng) 品 牌
4.產(chǎn) 品 展 示
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